As a leading global software company specialized in manufacturing execution system, equipment data acquisition(EDA), yield management system, interface A solution, EQM, enterprise quality management and semiconductor factory automation
DACrux / TEST Overview
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• Yield Management System
DACrux/TEST provides total YMS solution for semiconductor test floor optimization including automatic data collection to yield analysis applications. It helps to take prompt action for abnormal yield by analyzing and reporting test results in real-time. DACrux/TEST provides standardized data which complies with SEMI standard, IE422 spec. Therefore, it supports correlated analysis with other data and provides base for yield modeling.
DACrux/TEST provides total YMS solution for semiconductor test floor optimization including automatic data collection to yield analysis applications. It helps to take prompt action for abnormal yield by analyzing and reporting test results in real-time. DACrux/TEST provides standardized data which complies with SEMI standard, IE422 spec. Therefore, it supports correlated analysis with other data and provides base for yield modeling.
