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 Operation
 Clear work guide for operator and engineer
Preventing human error
Preventing error of subjective operation
Reducing fixed and repetitive manual work
Maximizing processing, engineering efficiency and productivity
Providing data accuracy with auto data collection
Analysis
Easy visual analysis
Systematic test and defect data collection
Yield management and analysis
Yield lowering factor management
Yield modeling by analyzing the yield loss factors
Reporting
Real-time yield monitoring
Prompt alarm for the yield ripple
Prompt process feedback for yield ripple
Properly adjusting the production capacity and the yield
Providing analysis report for decision-making
DACrux/TEST can be applied as various types of modules to the fab, which has test process operation or testing companies, which needs YMS solution.
FABless semiconductor (Design House)
IDM (Integrated Device Manufacture, FAB Foundry FAB
Assembly/Package and Test (Final Test)
Maximizing profits by early yield stabilization of new devices.
Reducing the yield loss cost by cutting the yield issue and analysis time.
Reducing fixed and repetitive manual tasks.
Sharing information on yield and tester utilization.
Analyzing and monitoring operation rates of handler, probe station and testers.
Offering Most Advanced Test Floor Solution to Reduce COT (Cost of Test)
Preventing quality issues before delivering products to customers.
Automating Test Program and Recipe Handling to Reduce Errors.
Increasing ROI by yield enhancement.
Providing the base for Yield Modeling
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