As a leading global software company specialized in manufacturing execution system, equipment data acquisition(EDA), yield management system, interface A solution, EQM, enterprise quality management and semiconductor factory automation

Home
Korean
China
sitemap
Contact




MES (Manufacturing Execution System)
FA (Factory automation)
EAM (Enterprise Asset Management)
EQM (Enterprise Quality Management)
 Enterprise Quality Management
Enterprise Quality Management
 EQM
Yield Management System
Yield Management Systems
EAI (Enterprise Application Integration)
BPM (Business Process Management)
RFID(Radio Frequency Identification)

 Enterprise Quality Management

HOME : EQM

   • Quality Management System

Enterprise Quality Management Enterprise Quality Management Overview EQM Overview Yield Management System Yield Management Systems

Demand increases in systematic QMS (Quality Management System) which uses standardized methodology to effectively process various quality activities for the general quality goal, customer satisfaction. Example includes PL methodology which provides objective quality decision making foundation between manufacturer, client and 6-sigma activities for process improvement.

EQM is Enterprise Quality Management that automates enterprise-wide quality assurance activities and enables overall business process improvement. It also manages risk management and process data management. YMS is yield improvement system that analyzes various factors and causes that can affect yield in manufacturing sites.

Quality Management System



Quality Management System
Overview Benefit Key Function Reference


DACrux is total EQM(YMS) solution that enables the use of statistical management such as 6 sigma, QC and SPC for the improvement of product quality and service level.

DACrux is based on DACrux/6 sigma that provides quantitative/qualitative analysis needed for DACrux/STAT and Six Sigma activities based on integrated frame. Also, two semiconductor related yield analysis products - DACrux/TEST, which is needed for Test floor optimization and yield improvement, and DACrux/DMS for defect data analysis, help systematic YMS implementation in manufacturing industries by providing total YMS solution for the data generated during testing.